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Relative Raman Intensity Calibration Through Fluorescent Glass Standards

Published online by Cambridge University Press:  02 July 2020

Edgar S. Etz
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD20899-8371, U.S.A.
Wilbur S. Hurst
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD20899-8371, U.S.A.
Steven J. Choquette
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD20899-8371, U.S.A.
Douglas H. Blackburn
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD20899-8371, U.S.A.

Extract

Attention has been given in the recent past to the various issues that arise from the general lack of standardized procedures for the calibration of Raman spectral intensity. With the increasing acceptance of analytical Raman methods and the availability of diverse types of commercial Raman systems, it becomes increasingly important that uniform calibration methods be developed that provide some means for the correction of the Raman instrument response function. As matters stand now, Raman spectra are typically not corrected for instrument-dependent variations in spectrometer sensitivity across the Raman range. Especially for measurements at different excitation wavelengths, this leads to often severe distortion of relative peak intensities which impedes calibration transfer and affects spectral matching in library search routines. These issues have been brought forth by the McCreery group to the point where national standards organizations (e.g., ASTM, NIST), federal regulatory agencies, the Raman instrument manufacturers, and the analytical Raman community, have taken note.

Type
Optical Microanalysis Via Molecular Spectroscopy
Copyright
Copyright © Microscopy Society of America

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References

1.Ray, K.G. and McCreery, R.L., Appl. Spectrosc. 51 (1997)108.CrossRefGoogle Scholar
2.Frost, K.J. and McCreery, R.L., Appl. Spectrosc. 52 (1998)1614.CrossRefGoogle Scholar
3.Etz, E.S., et al., Microscopy and Microanalysis, Vol.4, Suppl. 2 (1998),508.Google Scholar
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