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A Quantitative Evaluation of Microstructure by Electron Back-Scattered Diffraction Pattern Quality Variations

Published online by Cambridge University Press:  06 August 2013

Suk Hoon Kang
Affiliation:
Nuclear Materials Division, Korea Atomic Energy Research Institute, Daejeon 305-353, Korea
Hyung-Ha Jin
Affiliation:
Nuclear Materials Division, Korea Atomic Energy Research Institute, Daejeon 305-353, Korea
Jinsung Jang*
Affiliation:
Nuclear Materials Division, Korea Atomic Energy Research Institute, Daejeon 305-353, Korea
Yong Seok Choi
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea
Kyu Hwan Oh
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea
David C. Foley
Affiliation:
Department of Mechanical Engineering, Texas A&M University, College Station, TX 77843, USA
Xinghang Zhang
Affiliation:
Department of Mechanical Engineering, Texas A&M University, College Station, TX 77843, USA
*
*Corresponding author. E-mail: jjang@kaeri.re.kr
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Abstract

Band contrast (BC) is a qualitative measure of electron back-scattered diffraction (EBSD), which is derived from the intensity of the Kikuchi bands. The BC is dependent upon several factors including scanning electron microscope measurement parameters, EBSD camera setup, and the specimen itself (lattice defect and grain orientation). In this study, the effective factors for BC variations and the feasibility of using BC variations for the quantification of microstructure evolutions have been investigated. In addition, the effects of the lattice defect and the grain orientation on the BC variations are studied. Next, a shear-deformed microstructure of 316L stainless steel, which contains nanosized grains and a large portion of twin boundaries, is revealed by BC map and histogram. Recovery and recrystallization of shear-deformed 316L stainless steel are displayed by BC variations during isothermal annealing at 700 and 800°C, respectively. It is observed that the BC turns bright as the shear-deformed crystal structure is recovered or recrystallized.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2013 

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References

Engler, O. & Randle, V. (2010). Introduction to Texture Analysis. Boca Raton, London, New York: CRC Press.Google Scholar
Krieger Lassen, N.C., Juul Jensen, D. & Conradsen, K. (1992). Image-processing procedures for analysis of electron back scattering patterns. Scanning Microsc 6, 115121.Google Scholar
Mukherjee, S., Garmestani, H. & Chandra, N. (1995). Experimental investigation of thermally-induced plastic-deformation in MMCs using back scattered Kikuchi method. Scr Metall Mater 33, 9399.10.1016/0956-716X(95)00100-AGoogle Scholar
Wilkinson, A.J. & Dingley, D.J. (1991). Quantitative deformation studies using electron back scatter patterns. Acta Metall Mater 39, 30473055.Google Scholar
Wilkinson, A.J. & Dingley, D.J. (1992). The distribution of plastic deformation in a metal matrix composite caused by straining transverse to the fibre direction. Acta Metall Mater 40, 33573368.Google Scholar
Wilkinson, A.J., Gonzalez, G. & Dingley, D.J. (1992). The measurement of local plastic deformation in a metal-matrix composite by electron back scatter patterns. J Microsc 169, 255261.10.1111/j.1365-2818.1993.tb03302.xGoogle Scholar
Wright, S.I. & Nowell, M.M. (2006). EBSD image quality mapping. Microsc Microanal 12, 7284.10.1017/S1431927606060090Google Scholar