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Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling

Published online by Cambridge University Press:  07 August 2002

D.J.H. Cockayne*
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
D.R. McKenzie
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
W. McBride
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
C. Goringe
Affiliation:
Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, New South Wales 2006, Australia
D. McCulloch
Affiliation:
Department of Applied Physics, RMIT—City Campus, GPO Box 2476V, Melbourne, Victoria 3001, Australia
*
*Corresponding author
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Abstract

The technique of energy selected electron diffraction gives information about amorphous structures which can be used to characterize amorphous materials in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonable models consistent with the diffraction data.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2000

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