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Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

J. Yamasaki ,
N. Tanaka ,
S. Inamoto ,
Y. Nomura  and
K. Okazaki-Maeda
J. Yamasaki
Affiliation:
EcoTopia Sience Institute, Nagoya University, Nagoya, Aichi, Japan
N. Tanaka
Affiliation:
EcoTopia Sience Institute, Nagoya University, Nagoya, Aichi, Japan
S. Inamoto
Affiliation:
Department of Crystalline Materials Science, Nagoya University, Nagoya, Aichi, Japan
Y. Nomura
Affiliation:
Department of Crystalline Materials Science, Nagoya University, Nagoya, Aichi, Japan
K. Okazaki-Maeda
Affiliation:
Department of Chemistry, Osaka University, Toyonaka, Osaka, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 514 - 515
Copyright
Copyright © Microscopy Society of America 2012

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