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2-D Mapping of Ferroelectric Domains by Transmission Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

X Pan ,
C Nelson ,
Y Zhang ,
S Kim ,
B Winchester ,
L Chen ,
A Melville ,
C Adamo ,
D Schlom  and
C Folkman
...Show all authors
X Pan
Affiliation:
University of Michigan
C Nelson
Affiliation:
University of Michigan
Y Zhang
Affiliation:
University of Michigan
S Kim
Affiliation:
University of Michigan
B Winchester
Affiliation:
Penn State University
L Chen
Affiliation:
Penn State University
A Melville
Affiliation:
Cornell University
C Adamo
Affiliation:
Cornell University
D Schlom
Affiliation:
Cornell University
C Folkman
Affiliation:
University of Wisconsin
S Baek
Affiliation:
University of Wisconsin
C Eom
Affiliation:
University of Wisconsin

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1356 - 1357
Copyright
Copyright © Microscopy Society of America 2011