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Theoretical analysis of double-crystal spectrograph for high-resolution spectroscopy of laser-generated X-rays

Published online by Cambridge University Press:  09 March 2009

O. Renner  and
M. Kopecký
O. Renner
Affiliation:
Institute of Physics, Czechoslovak Academy of Sciences, 18040 Prague, Czechoslovakia
M. Kopecký
Affiliation:
Institute of Physics, Czechoslovak Academy of Sciences, 18040 Prague, Czechoslovakia
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Abstract

Vertical dispersion variant of the double-crystal spectrograph is analyzed and its basic quantitative characteristics (luminosity, resolving power) are computed using ray tracing code. It is shown that geometric apparatus smearing is minimized due to high dispersion and spectral resolution may considerably exceed the single-crystal diffraction limit. Performing high-resolution spectral work, the efficiency of the double-crystal apparatus exceeds that of the flat single-crystal spectrograph. The usefulness of this method in laser plasma spectroscopy is demonstrated analyzing the detection of phosphorus He-like resonance line and its satellites.

Type
Research Article
Information
Laser and Particle Beams , Volume 10 , Issue 4 , December 1992 , pp. 841 - 847
Copyright
Copyright © Cambridge University Press 1992

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References

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