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Soft laser-plasma X-ray source for differential absorption imaging of tracing elements in thin samples

Published online by Cambridge University Press:  01 July 2004

L. A. GIZZI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
C.A. CECCHETTI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
M. GALIMBERTI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
D. GIULIETTI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy Also at Dipartimento di Fisica, Università di Pisa and INFN, Pisa, Italy
A. GIULIETTI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
P. KOESTER
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
L. LABATE
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy Also at Dipartimento di Fisica, Università di Bologna, Bologna, Italy
S. LAVILLE
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
P. TOMASSINI
Affiliation:
Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy

Abstract

The differential imaging technique is particularly suitable for the detection of small concentrations of contrasts agents for biological and medical applications in samples using X-ray radiography. In this paper, we present an application of this technique using a laser-plasma soft X-ray source combined with a bent crystal. Using a Fresnel plate as a test object, we were able to obtain spatial resolutions of the order of a few tens of microns. The use of our configuration to perform differential imaging of a test-sample at the L2 edge of Br at 1,596 eV is finally demonstrated.

Type
Research Article
Copyright
© 2004 Cambridge University Press

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