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Ultrafast electron relaxation measurements on α-SiO2 using high-order harmonics generation

Published online by Cambridge University Press:  09 April 2001

H. MERDJI
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
S. GUIZARD
Affiliation:
Service de Recherche sur les Surfaces et l'Irradiation de la Matière, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
P. MARTIN
Affiliation:
Service de Recherche sur les Surfaces et l'Irradiation de la Matière, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
G. PETITE
Affiliation:
Service de Recherche sur les Surfaces et l'Irradiation de la Matière, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
F. QUÉRÉ
Affiliation:
Service de Recherche sur les Surfaces et l'Irradiation de la Matière, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
B. CARRÉ
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
J.F. HERGOTT
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
L. LE DÉROFF
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
P. SALIÈRES
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
O. GOBERT
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
P. MEYNADIER
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France
M. PERDRIX
Affiliation:
Service des Photons, Atomes et Molécules, DSM-DRECAM, CEA Saclay, 91191 Gif-sur-Yvette, France

Abstract

Time-resolved photoemission spectroscopy, using high order harmonics, is used to measure the energy relaxation rate of hot electrons in α-SiO2 with sub-picosecond time resolution. Our results indicate that electrons of 30 eV kinetic energy in the conduction band relax at a rate which is at least two orders of magnitude lower than the one of photo-excited carriers of a few eV. As a result, we give insight in the relaxation process of hot electrons and show that impact ionization probability per unit time is only of the order of 1/40 ps−1, in very strong contrast with the much higher value generally assumed in models of optical breakdown.

Type
ULIA-1 CONFERENCE PAPERS
Copyright
© 2000 Cambridge University Press

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