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Energy spectrum analysis for intense pulsed electron beam

Published online by Cambridge University Press:  28 November 2016

J. Shen
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
H.H. An
Affiliation:
Shanghai Institute of Laser plasma, China Academy of Engineering Physics, Shanghai 201800, China
H.Y. Liu
Affiliation:
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai 201800, China
G.E. Remnev
Affiliation:
Laboratory No.1, National Research Tomsk Polytechnic University, Tomsk 634050, Russia
A.V. Nashilevskiy
Affiliation:
Laboratory No.1, National Research Tomsk Polytechnic University, Tomsk 634050, Russia
D.Y. Li
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
J. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
H.W. Zhong
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
X.J. Cui
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
G.Y. Liang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
M. Qu
Affiliation:
Institute of Heavy Ion Physics, Peking University, Beijing 100871, China
S. Yan
Affiliation:
Institute of Heavy Ion Physics, Peking University, Beijing 100871, China
X.F. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
G.L. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
X. Yu
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
X.Y. Le
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, China
Corresponding
E-mail address:

Abstract

As the energy spread of intense pulsed electron beams (IPEB) strongly influences the irradiation effects, it has been of great importance to characterize the IPEB energy spectrum. With the combination of Child–Langmuir law and Monte Carlo simulation, the IPEB energy spectrum has been obtained in this work by transformation from the accelerating voltage applied to the diode. To verify the accuracy of this simple algorithm, a magnetic spectrometer with an imaging plate was designed to test the IPEB energy spectrum. The measurement was completed with IPEB generated by explosive emission electron diode, the pulse duration, maximum electron energy, total beam current being 80 ns, 450 keV, and 1 kA, respectively. The results verified the reliability of the above analysis method for energy spectrum, which can avoid intercepting the beam, and at the same time significantly improved the energy resolution. Some calculation and experimental details are discussed in this paper.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2016 

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References

Bly, J.H. (1979). Electron beam sterilization technology. Radiat. Phys. Chem. 14, 403414.Google Scholar
Cai, J., Guan, Q., Hou, X., Wang, Z., Su, J., & Han, Z. (2014). Isothermal oxidation behaviour of thermal barrier coatings with CoCrAlY bond coat irradiated by high-current pulsed electron beam. Appl. Surf. Sci. 317, 360369.CrossRefGoogle Scholar
Child, C.D. (1911). Discharge from hot cao. Phys. Rev. (Ser. I) 32(5), 492511.CrossRefGoogle Scholar
Cizmar, P., Müllerová, I., Jacka, M., & Pratt, A. (2007). New multichannel electron energy analyzer with cylindrically symmetrical electrostatic field. Rev. Sci. Instrum. 78, 053714.CrossRefGoogle ScholarPubMed
Ferrari, A., Sala, P.R., Fassò, A., & Ranft, J. (2005). Fluka:a multi-particle transport code. CERN-2005-10, INFN/TC_05/11, SLAC-R-773.Google Scholar
Gao, B., Hao, S., Zou, J., Wu, W., Tu, G., & Dong, C. (2007). Effect of high current pulsed electron beam treatment on surface microstructure and wear and corrosion resistance of an AZ91HP magnesium alloy. Surf. Coat. Technol. 201(14), 62976303.CrossRefGoogle Scholar
Hao, Y., Gao, B., Tu, G.F., Li, S.W., Hao, S.Z., & Dong, C. (2010). Surface modification of Al–20Si alloy by high current pulsed electron beam. Appl. Surf. Sci. 257(9), 39133919.CrossRefGoogle Scholar
Izumi, N., Snavely, R., Gregori, G., Koch, J.A., Park, H.S., & Remington, B.A. (2006). Application of imaging plates to x-ray imaging and spectroscopy in laser plasma experiments (invited). Rev. Sci. Instrum. 77, 10E325.Google Scholar
Kawai, M., Kawamura, Y., & Toyoda, K. (1983). Discrete energy spectrum of an intense relativistic electron beam. Phys. Lett. 99A, 387390.CrossRefGoogle Scholar
Kholodnaya, G., Ponomarev, D., Sazonov, R., & Remnev, G. (2014). Characteristics of pulsed plasma-chemical synthesis of silicon dioxide nanoparticles. Radiat. Phys. Chem 103, 114118.CrossRefGoogle Scholar
Langmuir, I. (1913). The effect of space charge and residual gases on thermionic currents in high vacuum. Phys. Rev. 2(6), 450486.CrossRefGoogle Scholar
Liu, Z.J., Le, X.Y., Jiang, X.L., & Han, L.J. (2005). Preparation of nanometer thin films with intense pulsed electron beam ablation. Surf. Coat. Technol. 193, 325328.Google Scholar
Mesyats, G.A. (1995). Ecton or electron avalanche from metal. Phys. – Usp. 38(6), 567591.CrossRefGoogle Scholar
Rogers, D.W.O., Kawrakow, I., Seuntjens, J.P., & Walters, B.R.B. (2010). NRC user codes for EGSnrc. NRCC Report PIRS-702(revB).Google Scholar
Tanaka, K.A., Yabuuchi, T., Sato, T., Kodama, R., Kitagawa, Y., Takahashi, T., Ikeda, T., Honda, Y., & Okuda, S. (2005). Calibration of imaging plate for high energy electron spectrometer. Rev. Sci. Instrum. 76, 013507.CrossRefGoogle Scholar
Urazbahtina, L.R., Remnev, G.E., Goncharov, D.V., & Pushkarev, A.I. (2004). Radiolysis of methyl alcohol water solution by pulsed electron beam. Russian-korean International Symp. on Science & Technology, Vol. 2, pp. 9194.Google Scholar
Wohn, F.K., Clifford, J.R., Carlson, G.H., & Talbert, W.L. (1972). a plastic scintillation detector for beta-ray spectrum measurements. Nucl. Instrum. Methods 101, 343352.CrossRefGoogle Scholar
Yu, X., Shen, J., Qu, M., Liu, W.B., Zhong, H.W., Zhang, J., Yan, S., Zhang, G.L., & Le, X.Y. (2015). Infrared imaging diagnostics for intense pulsed electron beam. Rev. Sci. Instrum. 86, 083305.CrossRefGoogle Scholar
Zhang, K.M., Zou, J.X., Bolle, B., & Grosdidier, T. (2013). Evolution of residual stress states in surface layers of an AISI D2 steel treated by low energy high current pulsed electron beam. Vacuum 87, 6068.CrossRefGoogle Scholar
Zhang, X.D., Hao, S.Z., Li, X.N., Dong, C., & Grosdidier, T. (2011). Surface modification of pure titanium by pulsed electron beam. Appl. Surf. Sci. 257(13), 58995902.CrossRefGoogle Scholar

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