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Surface stability of epitaxial SrRuO3 thin films in vacuum

Published online by Cambridge University Press:  01 December 2004

J. Shin*
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
S.V. Kalinin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.N. Lee
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.M. Christen
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
R.G. Moore
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
E.W. Plummer
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996
A.P. Baddorf
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
*
a) Address all correspondence to this author. e-mail: jshin4@utk.edu
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Abstract

Surface stability of nearly defect-free epitaxial SrRuO3 thin films grown by pulsed laser deposition was studied using low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and electron spectroscopies. Even after exposure to atmosphere, surfaces exhibited distinct LEED patterns providing evidence of unusual chemical stability. Surface order disappeared after heating to 200 °C in vacuum. To investigate, SrRuO3 thin films were annealed up to 800 °C in high vacuum and examined for chemical state and topography. Formation of unit-cell deep pits and the Ru-rich particles begins at low temperatures. Hydrocarbon contamination on the surface contributes to this process.

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 2004

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References

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