Skip to main content Accessibility help
×
Home
Hostname: page-component-564cf476b6-2fphr Total loading time: 0.264 Render date: 2021-06-23T04:03:48.185Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

Published online by Cambridge University Press:  03 March 2011

J. Sun
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287; and School of Materials Science and Engineering, Shanghai Jiao-tong University, Shanghai 20003, People’s Republic of China
Shaojun Liu
Affiliation:
Department of Chemical and Materials Engineering, Science and Engineering Materials Program, Arizona State University, Tempe, Arizona 85287
N. Newman
Affiliation:
Department of Chemical and Materials Engineering, Science and Engineering Materials Program, Arizona State University, Tempe, Arizona 85287
M.R. McCartney
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
David. J. Smith
Affiliation:
Center for Solid State Science, and Department of Physics and Astronomy, Arizona State University, Tempe, Arizona 85287
Get access

Abstract

The microstructure of Ba(Cd1/3Ta2/3)O3 ceramics with boron additive was investigated by high-resolution and analytical electron microscopy. Superlattice reflections were present at positions of (h ± 1/3, k ± 1/3, l ± 1/3) away from the fundamental reflections in the [110] zone diffraction pattern for the pseudocubic perovskite unit cell. Lattice images showed a well-ordered structure with hexagonal symmetry. No boron segregation and amorphous phase was observed along grain boundaries. An amorphous phase rich in boron-oxide was observed to form pockets partially penetrating along multiple grain junctions.

Type
Articles
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below.

References

1Wakino, K., Nishikawa, T., Ishikawa, Y. and Tamura, H, Br. Ceramic. Trans. J. 89, 39 (1990).Google Scholar
2Rong, G., Newman, N., Shaw, B. and Cronin, D., J. Mater. Res. 14, 4011 (1999).CrossRefGoogle Scholar
3Vandreah, T. A., Science 298, 1182 (2002).CrossRefGoogle Scholar
4Galasso, F. and Pyle, J., Inorg. Chem. 2, 482 (1963).CrossRefGoogle Scholar
5Kawashima, S., Nishida, M., Ueda, I. and Ouchi, H., J. Am. Ceram. Soc. 66, 421 (1983).CrossRefGoogle Scholar
6 K. Matsumoto, T. Hiuga, K. Takada, and H. Ichimura: Proceedings of the 6th IEEE International Symposium on Application of Ferroelectrics (IEEE, 1986), p. 118.Google Scholar
7Galasso, F. and Pyle, J., J. Phys. Chem. 67, 1561 (1963).CrossRefGoogle Scholar
8 S. Liu and N. Newman: (unpublished).Google Scholar
9Ganguii, A.K., Jayadevan, K.P., Subbanna, G.N. and Varma, K.B.R., Solid State Commun. 94, 13 (1995).CrossRefGoogle Scholar
10 S. Liu, J. Sun, D.J. Smith, and N. Newman: (unpublished).Google Scholar
11Davies, P. and Tong, J., J. Am. Ceram. Soc. 80, 1727 (1997).CrossRefGoogle Scholar
12Chai, L., Akbas, M.A., Davies, P.K. and Parise, J.B., Mater. Res. Bull. 32, 1261 (1997).CrossRefGoogle Scholar
13Jacobson, A.J., Collins, B.M. and Fender, B.E.F., Acta Cryst. B32, 1083 (1976).CrossRefGoogle Scholar
14Ho, I.C., J. Am. Ceram. Soc. 77, 829 (1994).CrossRefGoogle Scholar
15Lee, J.H., Heo, Y.W., Lee, J.A., Ryoo, Y.D., Kim, J.J. and Cho, S.H., Solid State Ionics 101–103, 787 (1997).CrossRefGoogle Scholar
16Rhim, S.M., Bak, H., Hong, S. and Kim, O.K., J. Am. Ceram. Soc. 83, 3009 (2000).CrossRefGoogle Scholar
17Levin, E.M. and McMurdie, H.F., Phase Diagram for Ceramists Supplement (American Ceramics Society Inc, 1975), p. 97.Google Scholar
18Subbarao, E.C. and Hummel, F.A., Phase Diagram for Ceramists (American Ceramics Society Inc., 1964), p. 109.Google Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *