Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-26T03:14:25.976Z Has data issue: false hasContentIssue false

THE MELLIN CENTRAL PROJECTION TRANSFORM

Published online by Cambridge University Press:  07 March 2017

JIANWEI YANG*
Affiliation:
School of Mathematics and Statistics, Nanjing University of Information Science and Technology, Nanjing, China, 210044 email yjianw@nuist.edu.cn
LIANG ZHANG
Affiliation:
School of Mathematics and Statistics, Nanjing University of Information Science and Technology, Nanjing, China, 210044 email yjianw@nuist.edu.cn
ZHENGDA LU
Affiliation:
School of Mathematics and Statistics, Nanjing University of Information Science and Technology, Nanjing, China, 210044 email yjianw@nuist.edu.cn
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The central projection transform can be employed to extract invariant features by combining contour-based and region-based methods. However, the central projection transform only considers the accumulation of the pixels along the radial direction. Consequently, information along the radial direction is inevitably lost. In this paper, we propose the Mellin central projection transform to extract affine invariant features. The radial factor introduced by the Mellin transform, makes up for the loss of information along the radial direction by the central projection transform. The Mellin central projection transform can convert any object into a closed curve as a central projection transform, so the central projection transform is only a special case of the Mellin central projection transform. We prove that closed curves extracted from the original image and the affine transformed image by the Mellin central projection transform satisfy the same affine transform relationship. A method is provided for the extraction of affine invariants by employing the area of closed curves derived by the Mellin central projection transform. Experiments have been conducted on some printed Chinese characters and the results establish the invariance and robustness of the extracted features.

Type
Research Article
Copyright
© 2017 Australian Mathematical Society 

References

Arbter, K., Snyder, W. E., Burkhardt, H. and Hirzinger, G., “Application of affine-invariant fourier descriptors to recognition of 3-d objects”, IEEE Trans. Pattern Anal. Mach. Intell. 12 (1990) 640647; doi:10.1109/34.56206.CrossRefGoogle Scholar
Bouyachchera, F., Boualia, B. and Nasri, M., “Clifford Fourier–Mellin moments and their invariants for color image recognition”, Math. Comput. Simulation 40 (2014) 2735; doi:10.1016/j.matcom.2014.11.005.Google Scholar
Flusser, J., Suk, T. and Zitov, B., Moments and moment invariants in pattern recognition (John Wiley and Sons, Chichester, UK, 2009); https://www.amazon.com/Moments-Moment-Invariants-Pattern-Recognition/dp/0470699876.CrossRefGoogle Scholar
Guo, L. and Zhu, M., “Quaternion Fourier–Mellin moments for color images”, Pattern Recognit. 44 (2011) 187195; doi:10.1016/j.patcog.2010.08.017.CrossRefGoogle Scholar
Hazewinkel, M. (ed.), “Mellin transform” in: Encyclopedia of mathematics, Volume 6 (Kluwer Academic Publishers, Dordrecht, The Netherlands, 1990) ;http://www.encyclopediaofmath.org/index.php?title=Mellin_transform&oldid=36080.Google Scholar
Hoang, T. V. and Tabbone, S., “Invariant pattern recognition using the rfm descriptor”, Pattern Recognit. 45 (2012) 271284; doi:10.1016/j.patcog.2011.06.020.CrossRefGoogle Scholar
Khalil, M. I. and Bayoumi, M. M., “A dyadic wavelet affine invariant function for 2d shape recognition”, IEEE Trans. Pattern Anal. Mach. Intell. 23 (2001) 11521163; doi:10.1109/34.954605.CrossRefGoogle Scholar
Lan, R. S. and Yang, J. W., “Whitening central projection descriptor for affine-invariant shape description”, IET Image Process. 7 (2013) 8191; doi:10.1049/iet-ipr.2012.0094.CrossRefGoogle Scholar
Lan, R. S. and Zhou, Y. Ch., “Quaternion-Michelson descriptor for color image classification”, IEEE Trans. Image Process. 25 (2016) 52815292; doi:10.1109/TIP.2016.2605922.CrossRefGoogle ScholarPubMed
Lan, R. S., Zhou, Y. Ch. and Tang, Y. Y., “Quaternionic local ranking binary pattern: a local descriptor of color images”, IEEE Trans. Image Process. 25 (2016) 566579; doi:10.1109/TIP.2015.2507404.CrossRefGoogle ScholarPubMed
Mennesson, J., Saint-Jean, C. and Mascarilla, L., “Color fouriercmellin descriptors for image recognition”, Pattern Recognit. Lett. 40 (2014) 2735; doi:10.1016/j.patrec.2013.12.014.CrossRefGoogle Scholar
Tang, Y. Y., Tao, Y. and Lam, E. C. M., “New method for extraction based on fractal behavior”, Pattern Recognit. 35 (2002) 10711081; doi:10.1016/S0031-3203(01)00095-4.CrossRefGoogle Scholar
Teh, C. and Chin, R., “On image analysis by methods of moments”, IEEE Trans. Pattern Anal. Mach. Intell. 10 (1988) 496513; doi:10.1109/34.3913.CrossRefGoogle Scholar