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XRD Acquisition Parameters for Detection of Weak Peaks

Published online by Cambridge University Press:  06 March 2019

P. W. Seabaugh ,
D. B. Sullenger ,
C. R. Hudgens ,
M, C. Nichols  and
D. R. Boehme
P. W. Seabaugh
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
D. B. Sullenger
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
C. R. Hudgens
Affiliation:
EG&G Mound Applied Technologies Miamisburg, Ohio
M, C. Nichols
Affiliation:
Sandia National Laboratories Livermore, California
D. R. Boehme
Affiliation:
Sandia National Laboratories Livermore, California
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Extract

The use of high-intensity, 8Kw, x-ray sources (Rigaku rotating-anode generator and wide - angle goniometer for this study) provides both opportunities and challenges. With high - intensity x-ray sources, detection limits can be lowered significantly while still offering count times of practical duration. On the other hand, the availability of high intensity x-ray sources puts greater demands on information extraction procedures and on the mechanical preciseness of sample containment and support. In particular we addressed the use of a cylindrical aluminum sample cell with a 0.010’’ polycrystalline (cold rolled) beryllium window electron –beam welded to an aluminum frame. See Figure 1. This cell permitted analysis of various air-sensitive specimens. The sample was pressed against the back of the beryllium window by a spring-loaded backing plate.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 313 - 318
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. Howard, S. A., SHADOW:. A. System for X-Ray-Diffraction Pattern Analysis (1988), Adv. in X-Ray Anal., 32; 523–530 (1989)Google Scholar
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3. Howard, S. A., Incorporating W*G Deconvolution in X-ray Rietveid Structure Refinement, Ph.D. Thesis. New York State College of Ceramics (1984).Google Scholar