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X-ray Line Broadening Analysis of Tl-Superconducting Films

Published online by Cambridge University Press:  06 March 2019

M. O. Eatough ,
D. S. Ginley  and
B. Morosin
M. O. Eatough
Affiliation:
Sandia National Laboratories Albuquerque, New Mexico 87185
D. S. Ginley
Affiliation:
Sandia National Laboratories Albuquerque, New Mexico 87185
B. Morosin
Affiliation:
Sandia National Laboratories Albuquerque, New Mexico 87185
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Abstract

Superconducting thin films (0.3-0.7μm) in the TI-Ca-Ba-Cu-0 system have been prepared on various single crystal substrates by sequential electron beam evaporation followed by appropriate sintering and annealing. Oxygen-annealed films show Tc as high as 110K and critical current densities to 600,000 A/cm2. X-ray diffraction analyses of these films show predominantly the Tl2Ca2Ba2Cu2O10 phase (c-parameter near 36Å), but some also contain up to 50 at% of the Tl2CaBa2Cu2O8 phase (c-parameter near 30Å). The complete absence of hkl reflections other than 00I demonstrates the highly oriented nature of the films as well as the absence of other Tl phases. The diffraction peaks are noticeably broader for the 36Å phase than for the 30Å phase. For a 0.7μm film such broadening is consistent with coherent sizes along the c-axis of 1200 - 1400Å and 500Å, respectively, for the 30Å and 36Å phases, and of strain values near 1.4-1.8 x 10-3 for both phases.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 145 - 151
Copyright
Copyright © International Centre for Diffraction Data 1989

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