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X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals

Published online by Cambridge University Press:  06 March 2019

Jun-ichi Chikawa
Affiliation:
University of Denver Denver, Colorado
Stanley B. Austerman
Affiliation:
Autonetics Anaheim, California
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Abstract

A double.crystal arrangement was employed in the symmetrical Laue arrangement [(+n, −n) setting]. A perfect BeO crystal was used for the first crystal of the double-crystal spectrometer. To obtain a high X-ray intensity, the thickness of the crystal was made to correspond to a maximum of Pendellosung interference. A slit was pieced between the first and second (specimen) crystals to select the X-rays which precisely satisfy the Bragg condition. The slit was adjusted to avoid significant Fraunhofer diffraction. In this method, the incident beam for the specimen crystal was parallel enough to obtain intrinsic rocking curves of the specimen crystal. As an application, the method was used for determination of the senses of slight strains in BeO crystals.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1967

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