Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T15:22:38.955Z Has data issue: false hasContentIssue false
  • English
  • Français

Oxidation/Reduction Melting Equilibria in the System BaO-½Y2O3-CuOx II. Powder X-Ray Analysis

Published online by Cambridge University Press:  06 March 2019

Winnie Wong-Ng  and
Lawrence P. Cook
Winnie Wong-Ng
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899
Lawrence P. Cook
Affiliation:
Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899
Get access

Abstract

X-ray powder diffraction together with several other analytical techniques have been used to characterize the phase formation and the melt compositions associated with the invariant reactions in the system BaO-½Y2O3-CuOx. In this report, the characterization results of the ternary eutectic reaction of the system, the melting of the high Tc compound Ba2YCU3O6+x, and the melting of the 'green phase' BaY2CuO5 are described. The minimum malting eutectic temperature of the system has been determined to be ≈ 925°C, which corresponds to the reaction of Ba2YCu3O6+x + CuO + BaCuO2 → Liquid. The melting of Ba2YCu3O6+x takes place at around 1015°C to yield BaY2CuO5 + Liquid. The green phase melts around 1270°C to yield BaY2O4, Y2O3 and liquid. All these melts were found to contain only a small amount of Y. Reduction of the copper was found to accompany melting.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 633 - 639
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Roth, R.S., Rawn, C.J., Beech, F., J.D, Whitler and Anderson, J.O., Ceramic Superconductor II, (M.F. Yan, Ed.), pp.13–26, 1988.Google Scholar
2. Roth, R.S., Davis, K.L. and Dennis, J.R., Adv. Ceram. Mat. 2 (38), 295, 1987.Google Scholar
3. Frase, K.G. and Clarke, D.R., Adv. Ceram. Mat. 2 (38) 295, 1987.Google Scholar
4. Wang, G., Hwu, S.J., Song, S.N., Ketterson, J.B., L.D, Marks, Poeppelmeier, K.R. and Mason, T.O., Adv. Ceram. Mat. 2 (38) 313, 1987.Google Scholar
5. Aselege, T. and Keefer, K., J. Mater. Res. 3[6], 1279 (1988).Google Scholar
6. Lay, K.W. & G.M, Renlund, Technical Report Number 89CRD096, General Motor Research & Development Center, 1989.Google Scholar
7. Maeda, M., Kadoi, M. and Ikeda, T., Jap. J. of Appl. Phys. 28(8), 1417 (1989).Google Scholar
8. Nevriva, N., Holba, F., Durcok, S., Zemanova, D., Pollert, E. and Triska, A., Physica C157, 334 (1989).Google Scholar
9. Wong-Ng, W. and Cook, L.P., Superconductivity and Ceramic Superconductors II, Ceramic Trans., Amer. Ceram. Soc, Westerville, OH, 18, 73 (1991).Google Scholar