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A New User Oriented Intelligent XRF Spectrometer System

Published online by Cambridge University Press:  06 March 2019

Y. Kataoka ,
N. Masukawa  and
K. Toda
Y. Kataoka
Affiliation:
Rigaku Industrial Corporation Takatsuki, Osaka, Japan
N. Masukawa
Affiliation:
Rigaku Industrial Corporation Takatsuki, Osaka, Japan
K. Toda
Affiliation:
Rigaku/USA, Inc. Danvers, Massachusetts USA
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Extract

The semi-quantitative analysis, which is called ‘Standardless Analysis’, plays a major role in X-ray fluorescent analysis, especially in the field of research and development. The main feature of the semi-quantitative analysis is the fact that the composition of a sample can be obtained directly from a qualitative scan without any prior knowledge of the sample.

Type
XIII. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1035 - 1046
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Kohno, H., Murata, M., Kataoka, Y., Arai, T.: Jpn Adv. X-Ray Anal., 19, 307 (1988)Google Scholar
2. Kataoka, Y.: The Rigaku Journal, 33, 6 (1989)Google Scholar
3. Huang, T, C., Lim, G., X-Ray Spectrom., 15, 245 (1986)Google Scholar