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Measurements of the Thermal Expansion Of Materials with High Melting Points by X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Richard Ebner ,
Michael Mantler  and
Michael Hoch
Richard Ebner
Affiliation:
University of Technology, Vienna Institute of Applied and Technical Physics Wiedner Hauptstrafie 8-10, A-1040 Vienna, Austria
Michael Mantler
Affiliation:
University of Technology, Vienna Institute of Applied and Technical Physics Wiedner Hauptstrafie 8-10, A-1040 Vienna, Austria
Michael Hoch
Affiliation:
University of Technology, Vienna Institute of Applied and Technical Physics Wiedner Hauptstrafie 8-10, A-1040 Vienna, Austria
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Extract

X-ray diffraction at temperatures above 2500K gives rise to a wide variety of problems. Not only is there the sample to be heated but also the attachment must be cooled properly, the sample's temperature to be measured and last but not least the sample evaporation to be considered, which sets a limit to the maximum temperature to be reached. There are still other factors limiting the specimen temperature, e.g. an emissivity of the specimen higher than that of the heating strip, a good electicai conductivity or a good thermal conductivity of the specimen material. All these influences were investigated in [1].

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 441 - 447
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

1. Ebner, R., Mantler, M. and Weber, F.: “The Temperature Profiles along Heating-Strips in High Temperature Chambers for XRD”, Adv. in X-Ray Analysis, Vol. 36.Google Scholar
2. American Institute of Physics Handbook, editor: Gray, D.E., 3.ed. (1972)Google Scholar
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