Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-18T05:42:42.512Z Has data issue: false hasContentIssue false
  • English
  • Français

Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF

Published online by Cambridge University Press:  06 March 2019

B. E. Artz  and
M. J. Rokosz
B. E. Artz
Affiliation:
Scientific Research Laboratory Ford Motor Company Dearborn, Michigan
M. J. Rokosz
Affiliation:
Scientific Research Laboratory Ford Motor Company Dearborn, Michigan
Get access

Extract

Methods of correction for matrix differences are required in X-ray Fluorescence (XRF) Analysis when the overall composition of the unknowns is substantially different from the available standards. Sample preparation techniques used to minimize matrix differences often require development time and can consume irreplaceable sample material. Alternatively, the increasing computer power available to the analyst and the refinement of computer programs using fundamental parameter calculations has made this approach more attractive.

A system-consisting of a Siemens SRS-1 wavelength dispersive spectrometer (WDS), a KEVEX 0810-A/NS880 energy dispersive spectrometer (EDS), software for data collection and manipulation and a 40 element version of the NRLXRF fundamental-parameters analysis program has been put together to simplify XRF analysis of samples lacking standards of a similar composition. This configuration is shown schematically in Figure I.

Type
II. XRF Methods: Practical, Mathematical
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 81 - 84
Copyright
Copyright © International Centre for Diffraction Data 1981

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Artz, B. E., Kelly, C. J., Short, M. A., “A Computer Control for an Xray Fluorescence Analysis Unit, Advances in X-ray Analysis, (18), 309–316,(1975).Google Scholar
2. Artz, B. E., Kao, E. C., Short, M. A., “Using DEC RSX-11M Operating System for X-ray Diffraction and Xray Fluorescence Analysis”, Advances in X-ray Analysis, 22, 425–431, (1979).Google Scholar
3. Criss, J. W., NRLXRF, A Fortran Program for X-ray Fluorescence Analysis, COSMIC Program #DOD-00065, Univ. of Georgia Computer Center, Athens, GA. (1977)Google Scholar
4. Schamber, F., Wodke, N., McCarthy, J., 12th Annual Conf. of M.A.S., Boston, Mass., paper 85, (1977).Google Scholar
5. Artz, B. E., “X-ray Fluorescence Analysis o f Catalytic Converters using Single-element Standards and Theoretical Corrections for Interelement E ffect”, X-ray Spectrometry, Vol. 6, No. 3, 165–170, (1977).Google Scholar