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The Effect of Various Pattern Aberrations on Figures of Merit Used With Whole Pattern Recognition Techniques

Published online by Cambridge University Press:  06 March 2019

D. K. Smith ,
S. Q. Hoyle  and
G. G. Johnson Jr
D. K. Smith
Affiliation:
Department of Geosciences and Intercollege Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
S. Q. Hoyle
Affiliation:
Department of Geosciences and Intercollege Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
G. G. Johnson Jr
Affiliation:
Department of Geosciences and Intercollege Materials Research Laboratory The Pennsylvania State University University Park, PA 16802
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Abstract

The affect of several aberrations on the figures of merit, FOM, used in the identification analysis of diffraction patterns has been examined by generating simulated diffraction traces with mathematically induced errors. Patterns of mixtures with random 20 shifts, intensity variations, and profile broadening were generated for analysis by MATCHDB, and the behavior of three FOMs during the search step was followed. The results have shown that the angle errors are the most serious in degrading the potential for identification of the phases in the mixtures. Intensity errors cause some degradation on the results. Broadening has little affect when using whole-pattern matching methods.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 67 - 77
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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