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Direct Quantative Determination of Silica by X-ray Diffraction on Pvc Membrane Filters

Published online by Cambridge University Press:  06 March 2019

W. W. Henslee  and
R. E. Guerra
W. W. Henslee
Affiliation:
Central Laboratory, Dow Chemical U.S.A. Freeport, Texas 77541
R. E. Guerra
Affiliation:
Central Laboratory, Dow Chemical U.S.A. Freeport, Texas 77541
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Abstract

Exposure of industrial workers to respirable crystalline silica is receiving considerable attention at present from industrial laboratories and regulatory agencies. Analytical methodology for rapid and accurate determinations of microgram quantities of silica is necessary. The X-ray diffraction method which has been recommended by NIOSH requires lengthy sample preparation.

An X-ray diffraction method has been developed for the quantitative analysis of α-quartz directly on polyvinyl chloride filters in the microgram range. The minimum detectable concentration of α-quartz is approximately 2μg/cm2. This represents a sensitivity comparable to that claimed using the Bumsted method. The necessity of ashing the filter and depositing the residue on silver membrane filters, as well as the addition of a standard, is avoided. This minimizes handling and alteration of the sample.

Type
X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 139 - 152
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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