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X-ray Diffraction of Plasma Nitrided Ti-6AI-4V

Published online by Cambridge University Press:  06 March 2019

A. Raveh
Affiliation:
also at NRC-Negev, P.O.Box 9001, Beer-sheva 84190, ISRAEL.
G. Kimmel
Affiliation:
Dept, of Mater. Eng-., Technion, Haifa 32000, ISRAEL
R. Avni
Affiliation:
also at NRC-Negev, P.O.Box 9001, Beer-sheva 84190, ISRAEL.
A. Grill
Affiliation:
Materials Engr. Dept., Ben-Gurion University of the Negev, P.O.Box 653, Beer-Sheva, ISRAEL
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Abstract

Ti-6Al-4V alloy has been nitrided in plasmas of N2 -H2 -Ar. The structure has been characterized by X-ray diffraction (XRD) for the determination of the products formed. The information was supported by elemental analysis with Auger Electron Spectroscopy (AES).

Three phases were identified as follows: δ-TiN, ε-Ti2N and α'-Ti (solid solution of nitrogen in titanium). The gas-feed composition affects the nitriding process as found from phase orientation and relative concentration of the products.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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