Skip to main content Accessibility help
×
Home
Hostname: page-component-564cf476b6-pxp6n Total loading time: 0.153 Render date: 2021-06-20T17:29:12.866Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

Published online by Cambridge University Press:  06 March 2019

Kenneth B. Schwartz
Affiliation:
Corporate Technology Raychem Corporation, Menlo Park, CA 94025
Robert B. Von Dreele
Affiliation:
LANSCE Los Alamos National Laboratory Los Alamos, NM 87545
Get access

Abstract

A full structure analysis of a completely crystallized sample of high-density polyethylene (HDPE) has been achieved using x-ray powder diffraction data collected on a laboratory-based powder diffractometer. The structure refinement is performed using the Rietveld method and includes refinement of the carbon and hydrogen atomic positions and temperature factors. The C-C and C-H bond distances and the C-C-C bond angle along the polyethylene chain have been calculated from the refined atomic positions and are in very good agreement with previous experimental and modelling determinations. Evaluations of the pseudo-Voigt profile parameters for Lorentzian strain broadening and me Scherrer coefficient for Gaussian broadening yield reasonable values for microstrain and particle size for this sample. Refinement of the preferred orientation parameter indicates that the HDPE flakes consist of platy crystals or lamellae that are packed normal to the diffraction vector.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below.

References

1. Rietveld, H. M., Journ. Appl. Cryst. 2, 65 (1969).Google Scholar
2. Young, R. A. in The Rietveld Method, IUCr Monographs on Crystallography. 5, International Union of Crystallography, Oxford University Press, Oxford, 1993, p. v.Google Scholar
3. Hay, J. N., Kemmish, D. J., Langford, J. I., Rae, A. I. M., Polymer Commun. 25, 175 (1984).Google Scholar
4. Hay, J. N., Kemmish, D. J., Langford, J. I., Rae, A. I. M., Polymer Commun. 26, 283 (1985).Google Scholar
5. Bunn, C. W., Trans. Faraday Soc. 35, 482 (1939).CrossRefGoogle Scholar
6. Kavesh, S., Schultz, J. M., Joum. Polymer Sci. :PartA-2 8, 243 (1970).Google Scholar
7. Iyengar, S. S., Percec, S., Powder Diffraction 9, 217 (1994).Google Scholar
8. Schwartz, K. B., Cheng, J., Reddy, V. N., Fone, M., Fisher, H. P., Advances in X-Ray Analysis 38, 495 (1995).Google Scholar
9. Larsen, A. C., Von, R. B Dreele, GSAS-Generalized Structure Analysis System, Los Alamos Report LAUR 86-748, Los Alamos National Laboratory USA (1986).Google Scholar
10. Dolasse, W. A., Journ. Appl. Cryst. 19, 267 (1986);Google Scholar
March, A., Zeit. Krist. 81, 285 (1932).Google Scholar
11. Billmeyer, F. W., Jr., Textbook of Polymer Science, 3rd Edition, Wiley-Interscience, New York, 1984, p 13.Google Scholar
12. Cernik, R. J., Cheetham, A. K., Prout, C. K., Watkin, D. J., Wilkinson, A. P., Willis, B. T. M., Joum. Appl. Cryst. 24, 222 (1991).Google Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *