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Micro X-Ray Fluorescence Analysis with Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

Shinjiro Hayakawa
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113, Japan
Atsuo Iida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics, Tsukuba-shi, Ibaraki 305, Japan
Sadao Aoki
Affiliation:
Institute of Applied Physics, University of Tsukuba, Tsukuba-shi, Ibaraki 305, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113, Japan
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Abstract

A synchrotron radiation X-ray micro analyzer(SRXMA) was developed at Photon Factory in Japan. The present SRXMA combines a double crystal monochromator and mirror optics and either a white or a monochromatic microbeam can be used. Micro X-ray fluorescence analysis was carried out, and a minimum detection limit of 1 ppm for Mn was obtained for 100 sec measurement with the white beam. With monochromatic beam excitation, micro X-ray spectroscopies are now feasible.

The obtained beam size was 1.6 μ;m - 34 μm* The beam was blurred in one direction by the scattered X-rays caused by the surface irregularities of the focusing mirror. Improvements in the mirror quality will ensure a beam spot of just a few microns with sufficient intensity.

Type
IV. Techniques and XRF Instrumentation
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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