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Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination

Published online by Cambridge University Press:  06 March 2019

Atsuo lida
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, HongoBunkyo-ku, Tokyo 113, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, HongoBunkyo-ku, Tokyo 113, Japan
Hideki Maezawa
Affiliation:
Photon Factory, National Laboratory for-High Energy Physics, Oho-machi, Tsukubagun, Ibaraki 305, Japan
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Abstract

Micro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

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