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X-Ray Diffraction Intensity of Oxife Soild Soultions: Application to Qualitative and Quantitative Phase Analysis

Published online by Cambridge University Press:  06 March 2019

Ronald C. Gehringer ,
Gregory J. McCarthy ,
R.G. Garvey  and
Deane K. Smith
Ronald C. Gehringer
Affiliation:
Department of Chemistry, North Dakota State University, Fargo, ND 58105
Gregory J. McCarthy
Affiliation:
Department of Chemistry, North Dakota State University, Fargo, ND 58105
R.G. Garvey
Affiliation:
Department of Chemistry, North Dakota State University, Fargo, ND 58105
Deane K. Smith
Affiliation:
Department of Geosciences, The Pennsylvania State University, University Park, PA 16802
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Extract

Solid solutions are pervasive in minerals and in industrial inorganic materials. The analyst is often called upon to provide qualitative and quantitative X-ray phase analysis for specimens containing solid solutions when all that is available are Powder Diffraction File (PDF) data or commercial standards for the end members. In an earlier paper (1) we presented several examples of substantial errors in accuracy of quantitative analysis that can arise when the crystallinity and composition of the analyte standard do not match those of the analyte in the sample of interest. We recommended that to obtain more accurate quantitative analyses, one should determine the analyte composition (e.g., from XRF on grains seen in a SEM or from comparison of cell parameters with those of the end members) and synthesize an analyte standard with this composition and with a crystallinity approximating that of the analyte (e.g., as determined from peak breadth or α1/ α2 splitting).

Type
III. Quantitative XRD Analysis
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 119 - 128
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. McCarthy, G.J., Gehringer, R.C., Smith, D.K., Injaian, V.M., Pfoertsch, D.E. and Kabel, R.L., Adv. X-Ray Anal., 2A, Smith, D.K., Barrett, C., Leyden, D.E. and Predecki, P.K., Eds., Plenum Publ. Corp., pp. 253–264 (1981).Google Scholar
2. Morris, M.C., McMurdie, H.F., Evans, E.H., Baretzkin, B., Parker, H.S. and Pyrros, N.C., National Bureau of Standards Monograp. 25, Section 18, p. 3 (1981).Google Scholar
3. Gehringer, R.C., Thesis, M.S., North Dakota State University (1983).Google Scholar
4. Klug, H.P. and Alexander, L.E., X-Ray Diffraction Procedures, 2nd Ed., Wiley Interscience, New”York (l974).Google Scholar
5. Cline, J.P. and Snyder, R.L., (this volume).Google Scholar
6. Hubbard, C.R., Robbins, C.R., and Snyder, R.L., (this volume).Google Scholar