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Microstructural glass modifications in as-fired and high-voltage-surged RuO2-based thick film resistors
Published online by Cambridge University Press: 31 January 2011
Abstract
Electrical conduction in thick film resistors has been studied, and microstructures, especially around conducting RuO2 phases in a lead-borosilicate glass matrix in as-fired and high-voltage-surged thick film resistors, have been observed in detail using transmission electron microscopy. Lattice images of as-fired thick film resistors have suggested the presence of subtle structural modifications in the very thin area across the RuO2/glass interface, whereas in the glass matrix very small dot-like contrasts on the order of 1 nm were occasionally observed and were interpreted as being small crystallites or Ru clusters. Heavy electrical loadings of thick film resistors were found to induce the local formation of plate-like crystals in glass, which were identified by electron diffraction to be a slightly modified anorthite. The significance of these observations in terms of the conduction network and the degradation due to the electrical overloading of thick film resistors are discussed.
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- Copyright © Materials Research Society 1991
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