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Instrumentation for Synchrotron X-Ray Powder Diffractometry

Published online by Cambridge University Press:  06 March 2019

W. Parrish
Affiliation:
IBM Research Laboratory San Jose, California 95193
M. Hart
Affiliation:
IBM Research Laboratory San Jose, California 95193
C. G. Erickson
Affiliation:
IBM Research Laboratory San Jose, California 95193
N. Masciocchi
Affiliation:
IBM Research Laboratory San Jose, California 95193
T. C. Huang
Affiliation:
IBM Research Laboratory San Jose, California 95193
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Abstract

The instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

1. Winick, H. and Doniach, S., eds., “Synchrotron Radiation Research” Plenum, Press, New York, (1980).Google Scholar
2. Parrish, W., “X-Ray Analysis Papers”, Centrex Publishing Co., Eindhoven (1965).Google Scholar
3. Parrish, W., Hart, M. and Huang, T.C., “Synchrotron X-Ray Polycrystalline Diffractometry”, I. Appl, Cryst., 19 : in press (1986).Google Scholar
4. Hastings, J.B., Thomtinson, W. and Cox, D.E., “Synchrotron X-Ray Powder Diffraction”, I- Appl. Cryst., 17: 85 (1984).Google Scholar
5. Parrish, W. and Hart, M., “Synchrotron Experimental Methods for Powder Structure Refinement”, Trans. Am. Cryst. Assoc., 20 : in press (1985).Google Scholar
6. Mantler, M. and Parrish, W., “Energy Dispersive X-Ray Diffractometry”, Adv. in X-Ray Anal., 20: 171 (1977).Google Scholar