Hostname: page-component-8448b6f56d-jr42d Total loading time: 0 Render date: 2024-04-25T05:11:12.540Z Has data issue: false hasContentIssue false

The Study about the Control of Defect Factors to Improve Properties of P(VDF-TeFE) Thin Film

Published online by Cambridge University Press:  17 June 2011

Jong-Hyeon Jeong
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Daiki Terashima
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Chiharu Kimura
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Hidemitsu Aoki
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Get access

Abstract

In order to apply P(VDF-TeFE) piezoelectric polymer to micro-generator as a membrane, the polymer is deposited on a substrate by spin-coating method. Since a solvent affects the film properties and surface stability, we have carried out the thermal process at a temperature higher than melting point. In the annealing process of a P(VDF-TeFE) thin film, electrical properties of the film was improved by an application of an electric field. The established study was the investigation of variations in characteristics by an application of a certain electric field. We have attempted to measure about the critical intensity of an electric field and investigate what the influences of the application is caused using a XPS spectrum in this study. Moreover, in order to control the intrusion of impurities, we have used the vacuum chamber to carry out the annealing process in it.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Williams, C.B. Shearwood, C., Harradine, M. A., Mellor, P. H., Birch, T. S., and Yates, R. B., IEEE proc. Circuits, Devices and Systems, vol. 148, no. 6, pp. 337342 (2001).Google Scholar
2. Amirtharajah, R. and Chandrakasan, A.P., IEEE J. Solid-State Circuits, vol. 33, no. 5, pp. 687695 (1998).Google Scholar
3. Roundy, S.J., Doctoral dissertation, Dept. of Mechanical Eng., Univ. of California, Berkeley (2003).Google Scholar
4. Schenck, N.S. and Paradiso, J.A., IEEE Micro, vol. 21, no. 3, pp. 3042 (2001).Google Scholar
5. Su, H., Strachan, A., and Goddard, W. A. III: Phys. Rev. B 70, 064101 (2004).Google Scholar
6. Chen, H., Dong, X., Zeng, T., Zhou, Z., and Yang, H.: Ceram. Int. vol. 33, pp. 1369 (2007).Google Scholar
7. Olcum, S. et al. , IEEE Transactions on Ultrasonic, Ferroelectric, and Frequency Control, vol. 52, no. 12 (2005).Google Scholar
8. Nakhmanson, S. M., Buongiorno Nardelli, M., and Bernholc, J.: Phys. Rev. Lett. 92, 115504 (2004).Google Scholar
9. Baise, A. I., Lee, H., Oh, B., Salomon, R. E., and Labes, M. M.: Appl. Phys. Lett. 26, pp. 428 (1975).Google Scholar
10. Wang, Z. Y., Su, K. H., Fan, H. Q., and Wen, Z. Y.: Polymer, vol. 48, pp. 7145 (2007).Google Scholar
11. Kawai, H., Japanese Journal of Applied Physics, vol. 8, pp. 975976 (1969).Google Scholar
12. Lando, J. B. and Doll, W. W.: J. Macromol. Sci. Phys. B 2, pp. 205 (1968).Google Scholar
13. Hicks, J. C., Jones, T. E., and Logan, J. C.: J. Appl. Phys. 51, pp. 1135 (1980).Google Scholar
14. Fukada, E. and Takashita, S.: Jpn. J. Appl. Phys. 8, pp.960 (1969).Google Scholar
15. Wen, J. X., Polymer Journal, vol. 17, no. 2, pp. 399407 (1985).Google Scholar
16. Jeong, J. H., Kimura, C., Aoki, H., Okuyama, M. and Sugino, T.: ECS Trans. 19, pp.59 (2009).Google Scholar
17. Jeong, J. H., Kimura, C., Aoki, H. and Sugino, T.: Jpn. J. Appl. Phys. 49, 04DK23 (2010).Google Scholar
18. Dementjev, A.P. and Maslakov, K.I., Appl. Surf. Sci. 253, pp. 1095 (2006).Google Scholar
19. Schindler, M., Hawthorne, F.C., Freund, M.S., and Burns, P.C., Geochim. Cosmochim. Acta, vol. 73, pp. 2488 (2009).Google Scholar
20. Lanceros-Mendez, S., Mano, J. F., Costa, A. M., and Schmidt, V. H.: J. Macromol. Sci., B 40, pp. 517 (2001).Google Scholar
21. Mihaly, J., Sterkel, S., Ortner, H. M., Kocsis, L., Hajba, L., Furdyga, E., and Mink, J.: Croat. Chem. Acta, vol. 79, pp. 497 (2006).Google Scholar
22. Chlopek, J., Morawska-Chochol, A., and Paluszkiewicz, C.: J. Mol. Struct., vol. 875, pp. 101 (2008).Google Scholar