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2018-05-21T09:18:56+00:00
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Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy
Microsc. Microanal. Proceedings, (2018), 24, S1, 972-973, doi: 10.1017/S1431927618005354
https://doi.org/10.1017/S1431927618005354 Published online by Cambridge University Press
J Wang
University of Texas-Dallas
G Lian
IBM
MJ Kim
University of Texas-Dallas
Not for further distribution unless allowed by the License or with the express written permission of Cambridge University Press.
https://doi.org/10.1017/S1431927618005354
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