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Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 5 / September 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 418-423
- Print publication:
- September 2001
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- Article
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