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High-Accuracy Sample Preparation for Three Dimensional Atom Probe Tomography Using Orthogonal Column Layout FIB-SEM and its STEM function
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 830-831
- Print publication:
- August 2018
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STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 604-605
- Print publication:
- July 2016
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