The two-dimensional snake scanning of the CCD method provides an effective solution to measure small-scale light spots which are smaller than one CCD pixel. The influences of the A/D conversion digits and response uniformity of the CCD on the measurement error are studied. When the A/D conversion digit is 20, the measurement error can be ignored. The maximum error value of the nonuniform response of the CCD pixel when the order of the super-Gaussian function is 10 is 0.7 μm. The research results can be used to guide the experiment.

The performance of polycrystalline CdTe photovoltaic thin films is expected to depend on the grain boundary density and corresponding grain size of the film microstructure. However, the electrical performance of grain boundaries within these films is not well understood, and can be beneficial, harmful, or neutral in terms of film performance. Electron backscatter diffraction has been used to characterize the grain size, grain boundary structure, and crystallographic texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with microstructure. Weak fiber textures were observed in the as-deposited films, with (111) textures present at lower deposition pressures and (110) textures observed at higher deposition pressures. The CdCl2-treated samples exhibited significant grain recrystallization with a high fraction of twin boundaries. Good correlation of solar cell efficiency was observed with twin-corrected grain size while poor correlation was found if the twin boundaries were considered as grain boundaries in the grain size determination. This implies that the twin boundaries are neutral with respect to recombination and carrier transport.

Solar cells fabricated from a sputtering target with 5% cadmium sulfide (CdS) intermixed cadmium telluride (CdTe) material was studied using Capacitance-Voltage (CV) profiling. The average efficiency of a set of these novel solar cells under one sun illumination was observed to be 7.56%. In contrast with standard sputtered CdS/CdTe cells, the junction capacitance of the mixed compound device was observed to show minimal change in the entire reverse bias range. The element mapping of the film using Bright Field Scanning Transmission Electron Microscopy (BF-STEM) was used to determine the distribution of S, Te, Cd, O, and Cl in CdTe film. From these observations, it is believed that the morphology and composition of the film resulted in a built-in potential which was sufficient to completely deplete the film.

Magnetron sputtering (MS) of CdTe and related II-VI materials facilitates low energy ion and electron bombardment that promotes good film growth at substrate temperatures well below those needed for other physical vapor deposition methods. MS also provides good control of deposition rates while allowing scale-up to large areas. In this paper we review the use of MS for deposition of polycrystalline thin films of CdS, CdTe and related materials for solar cells with a focus on reducing the thickness. We relate the deposition conditions and plasma properties determined by Langmuir probe measurements to some of the materials properties of the films through spectroscopic ellipsometry and high resolution electron microscopy. For cells with CdTe layers from 0.35 to 2.5 μm, we have done a first-order optimization of chloride treatment conditions and back contact structure. We discuss the influence of CdTe thickness and post-deposition processing on the efficiency, open-circuit voltage, short-circuit current, and fill factor and show that 10% efficient cells can be fabricated with 0.5 μm of CdTe.

We have studied the photoluminescence of CdTe crystals doped with two elements, Cu and Cl, that are frequently used in CdTe-based solar cells. Ions were implanted into high-quality single crystals of CdTe at the Toledo Heavy Ion Accelerator Lab in our Department. We used a standard Monte Carlo simulation program to plan an implant dosage at three different energies. The lattice damage was removed by thermal annealing in an inert atmosphere using a proximity cap to avoid surface deterioration. The PL spectra at 40K were obtained at 488 nm or 752nm to match the absorption depth with the implant profile. Using implant densities typically of 1016, 1017, and 1018 /cm3, and laser excitation power densities ranging over several orders of magnitude, we have identified band-to-band transitions, free-to-bound transitions, bound-exciton lines, and donor-acceptor pair transitions related to these species.

The highest performance CdS/CdTe thin film solar cells are generally completed with a Cucontaining back contact. The copper appears to be critical for achieving heavy p-type doping of the CdTe at the contact to permit the formation of a low resistance contact. In previous extended x-ray absorption fine structure (EXAFS) work we have inferred that most of the Cu in CdTe films resides as Cu2O at the boundaries of CdTe grains in films that have received a chloride treatment in the presence of oxygen, a critical step needed to improve the performance of all CdTe thin-film cells. This has suggested a mechanism for grain boundary passivation in thinfilm CdTe solar cells. We believe most of the diffused Cu decorates grain boundaries as oxides, consistent with the low doping densities typically observed in CdTe solar cells. The significance for grain boundary passivation will be discussed. We also find evidence that the grain-boundary Cu2O in CdCl2 treated CdTe films is unstable and tends to transform to CuO under some stress conditions.

We have used the fine structure in the Cu K-edge x-ray absorption spectrum to help elucidate the lattice location of Cu in polycrystalline, thin-film CdTe solar cells. In particular, we have studied how the typical CdCl2 vapor treatment in dry air changes the local environment of the Cu in CdTe. We find the Cu absorption spectrum to be similar to that of Cu2Te in the as-deposited CdTe film but to convert to a spectrum similar to Cu2O environment after the vapor CdCl2 treatment.