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The method of intensity ratios can be used for quantitative x-ray diffraction analysis even when none of the diffraction peaks of any phase can be individually resolved. The method uses intensity values from a finite number of discrete integration intervals and appropriate reference-intensity-ratios measured on a set of reference samples to yield a best fit composite pattern that is matched to the unknown by least-squares refinement. Solid-solution phases are analyzed by using multiple reference patterns and determining the best choice during the pattern matching procedure. The method may be extended easily to employ whole diffraction traces by using a large number of small intervals.
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