4 results
Nanofabrication Limits in Layered Ferroelectric Semiconductors via He-ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 262-263
- Print publication:
- July 2017
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Building with Ions: Development of In-situ Liquid Cell Microscopy for the Helium Ion Microscope.
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 754-755
- Print publication:
- July 2016
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Inverse Problem Solution for Quantitative Investigations of Nanocrystals Formation and Growth
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 794-795
- Print publication:
- July 2016
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Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1691-1692
- Print publication:
- August 2015
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