6 results
Nanofabrication Limits in Layered Ferroelectric Semiconductors via He-ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 262-263
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- July 2017
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Inverse Problem Solution for Quantitative Investigations of Nanocrystals Formation and Growth
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 794-795
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- July 2016
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Polarization Control via He-ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 158-159
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- July 2016
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Modeling Ion Beam Induced Secondary Electrons
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1689-1690
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- August 2015
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High-Resolution STEM Analysis of Nanoparticle Materials
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1438-1439
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- August 2013
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Imaging Plasmon Modes in Metallic Nanostructures with Correlated Optical and Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1638-1639
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- July 2011
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