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In-Situ and Ex-Situ Studies of Silicon Interfaces and Nanostructures by Ellipsometry and Rds
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 371
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- 1995
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Towards a Microscopic Interpretation of the Dielectric Function of Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 209
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- 1995
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Contribution of the Nanocrystallites and Their Interfaces to the Optical Response of Porous Silicon Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 429
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- 1994
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Degradation of Porous Si Layers Caused by Thermal Treatment
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- Journal:
- MRS Online Proceedings Library Archive / Volume 283 / 1992
- Published online by Cambridge University Press:
- 28 February 2011, 281
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- 1992
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