21 results
Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in Connectomics
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- Microscopy and Microanalysis / Volume 26 / Issue 3 / June 2020
- Published online by Cambridge University Press:
- 07 April 2020, pp. 403-412
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- June 2020
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Application of Missing Wedge Inpainting in Material Science
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 440-441
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- August 2019
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An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 154-155
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- August 2019
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Deep Learning for Sparse Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 158-159
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- August 2019
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Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 196-197
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- August 2019
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Sparse and Adaptive Sampling in Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S1 / February 2019
- Published online by Cambridge University Press:
- 07 February 2019, pp. 29-30
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- February 2019
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Fact or Fiction: Maximal Image Quality with Minimal Dwell Time
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 480-481
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- August 2018
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Blob-based Algebraic Reconstruction Technique for Computed Laminography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 994-995
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- August 2018
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Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 700-701
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- August 2018
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High-Throughput Large Volume SEM Workflow using Sparse Scanning and In-painting Algorithms Inspired by Compressive Sensing
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 150-151
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- July 2017
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A Comparative Study of Three Marker Detection Algorithms in Electron Tomography
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1044-1045
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- July 2016
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“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 632-633
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- July 2016
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Advanced recording schemes for electron tomography
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- MRS Bulletin / Volume 41 / Issue 7 / July 2016
- Published online by Cambridge University Press:
- 07 July 2016, pp. 537-541
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- July 2016
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Dictionary-based Filling of the Missing Wedge in Electron Tomography
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 554-555
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- July 2016
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Combined Tilt- and Focal-Series Tomography for HAADF-STEM
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- Microscopy Today / Volume 24 / Issue 3 / May 2016
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- 28 April 2016, pp. 26-31
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- May 2016
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Marker Detection in Electron Tomography: A Comparative Study
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- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
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- 25 November 2015, pp. 1591-1601
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- December 2015
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Ettention: Building Blocks for Iterative Reconstruction Algorithms
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1601-1602
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- August 2015
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Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2337-2338
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- August 2015
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Matched Backprojection Operator for Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
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- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 05 June 2015, pp. 725-738
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- June 2015
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TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 786-787
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- August 2014
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