Low sheet resistance (high mobility) with high transmittance in all wavelength is required for front TCO. High haze value is also required for effective light trapping. For this purpose, we have combined F-doped SnO2 (FTO) with high mobility deposited by LPCVD and reactive ion etching (RIE) processed glass substrate. However, two problems have been found. (1) The mobility of FTO on RIE substrate dropped from that on flat glass (75 to 36 cm2/Vs). To avoid this drop, thicker film is needed. (2) To keep high transmittance with thicker film, lower carrier concentration is needed. But the mobility dropped with lower carrier concentration. In order to solve these constrains, we have adopted a stacked structure using thick non-doped layer of 2700 nm and thin F-doped layer of 500 nm. With this novel approach, we have successfully achieved the high mobility (80 cm2/Vs), low carrier concentration (2.2x1019 /cm3) and high haze value (77% at wavelength of 1000 nm) at the same time. This new developed high-haze SnO2 is a new promising TCO for thin-film Si solar cells.