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Novel Workflow for Improved Throughput, Turnaround Time, and Cross Section Preparation of Microelectronic Devices

Application of Low kV EELS to Problematic Samples

Nanoscale Investigation of Thermal Alteration of Chondritic Meteorites via Simultaneous Secondary and Transmitted Electron Imaging during In Situ Heating up to 1000 oC

Development of an Easy-to-Use Cryo-Electron Microscope for Simultaneous Observation of SEM and Transmission Images

Low-Voltage Energy-Dispersive X-ray Spectroscopy and Electron Energy-Loss Spectroscopy Analysis of Presolar Graphite Spherules

Insights Into the Structure of the Ligand Capping Layer of Inorganic Nanostructures via Multi kV Electron Microscopy Analysis

Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

High Contrast SEM Observation of Semiconductor Dopant Profile using TripleBeam® System

EELS Investigation of Al2O3 at 30 keV and below; First Results of Alumina's Structural Sensitivity to a Low-Energy Electron Beam

Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?

STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

The First Results of the Low Voltage Cold-FE SEM/STEM System Equipped With EELS

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