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Semiconductor and Soft Material Analysis with Low-kV TEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 456-457
- Print publication:
- August 2019
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Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 604-605
- Print publication:
- August 2014
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