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Aberration-Corrected STEM Imaging Through Off-Site Remote Operation
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1330-1331
- Print publication:
- July 2010
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Hardware Considerations to Optimize Zernike Phase Contrast TEM for Cryo-tomography and Single Particle Data Acquisition
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 554-555
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- July 2010
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New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1072-1073
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- August 2008
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Remote Teaching for Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 872-873
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- August 2008
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