29 results
Atom Probe Tomography Productivity Enhancements
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 522-523
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1118-1119
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
A High Multiple Hits Correction Factor for Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1084-1085
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography of Reduced Phases in Apollo 16 Regolith Sample 61501,22
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 720-721
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Approaches for Promoting Accurate Atom Probe Reconstruction
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 664-665
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Correlative NanoSIMS and Atom Probe Study of Nacre: Toward Understanding Polymorphism Effects in a Chinese Pearl
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 242-243
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Correlative t-EBSD Tomography and Atom Probe Tomography Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 682-683
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 702-703
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Atom probe tomography of nanoscale electronic materials
-
- Journal:
- MRS Bulletin / Volume 41 / Issue 1 / January 2016
- Published online by Cambridge University Press:
- 08 January 2016, pp. 30-34
- Print publication:
- January 2016
-
- Article
- Export citation
Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 851-852
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 687-688
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 849-850
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 41-42
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Reverse Engineering at the Atomic Scale: Competitive Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode
-
- Journal:
- Microscopy Today / Volume 22 / Issue 5 / September 2014
- Published online by Cambridge University Press:
- 29 August 2014, pp. 12-19
- Print publication:
- September 2014
-
- Article
-
- You have access
- HTML
- Export citation
Performance Advances in LEAP systems
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1120-1121
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Improving Data Quality in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2088-2089
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Measurement of Detection Efficiency in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1160-1161
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Progress in Planar Feature Spatial Reconstruction for Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 936-937
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Improved Mass Resolving Power and Yield in Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 994-995
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Application of Atom Probe Tomography to Atomic Layer Deposited Thin Films
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1028-1029
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation