9 results
Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 196-197
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- July 2017
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A new detection scheme for van der Waals heterostructures, imaging individual fullerenes between graphene sheets, and controlling the vacuum in scanning transmission electron microscopy
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 460-461
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- July 2017
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Position-sensitive STEM detectors for high-sensitivity phase detection
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1180-1181
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- August 2013
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Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 538-539
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- August 2013
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Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1876-1877
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- August 2013
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Insights Into Energy Materials Through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1354-1355
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- July 2012
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Dynamics and White Light Emission from CdSe Nanocrystals
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1830-1831
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- July 2012
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Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 344-345
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- July 2012
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Study of Selected Grain Boundaries in CdTe by Aberration-corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 424-425
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- July 2012
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