11 results
Spectral Deconvolution and Quantification in EDS Using Low Energy X-ray Lines From Steel Spectra
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 404-405
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- July 2016
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Evaluation of Combined Quantification of Cr-Ni Steel using EDS and WDS
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1879-1880
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- August 2015
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Advanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1716-1717
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- August 2014
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Element Analysis by EDX for Life Science: Light Elements and Bio-Mineralization
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 222-223
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- August 2013
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Advances in X-ray Microtomography in SEM with Submicron Spatial Resolution: Applications in Life, Earth and Material Sciences
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 622-623
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- August 2013
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EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1064-1065
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- July 2012
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High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 892-893
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- July 2011
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Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 600-601
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- July 2011
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Chemical and Structural Analysis in 3D: Combining μ-XRF, EDS, and EBSD Data Sets
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1000-1001
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- July 2011
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Applications Using an Annular Four-Channel Silicon Drift Detector
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1302-1303
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- July 2010
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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1314-1315
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- July 2010
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