Migraine with aura is one of the causes of stroke mimics. We retrospectively reviewed the 10-year medical records of patients who were treated with acute stroke management protocol. We analyzed the frequency and characteristics of patients with a final diagnosis of migraine with aura. Among the 1355 patients with stroke mimics, migraine with aura was the final diagnosis in 36 patients (2.7%). The most common auras included sensory and brainstem auras followed by motor, visual, and speech/language auras. One patient manifested transient atrial fibrillation during the migraine attack, which can be a link with acute stroke.

We demonstrate the tungsten disulfide (WS2) thin film catalysts prepared by the sulfurization of vacuum deposited WO3 thin films for efficient hydrogen production with over 90% Faradaic efficiency. The 23-nm-thick WS2 thin film catalyst heterojunction with p-type silicon photocathode could exhibit a photocurrent density of 8.3 mA/cm2 at 0 V versus a reversible hydrogen electrode (RHE), a low onset potential of 0.2 V versus RHE when photocurrent density reaches −1 mA/cm2 and long-term stability over 10 h. The enhanced catalytic activities of WS2/p-Si photocathodes compared with the bare p-Si photocathode originate from a number of edge sites in the synthesized polycrystalline thin films, which could act as hydrogen evolution catalyst.

Cultivated soybeans [Glycine max (L.) Merr.] have various flower colours such as dark purple, purple, light purple, pink, magenta, near white and white. About one-third of the soybean accessions in the United States Department of Agriculture – Germplasm Resource Information Network (USDA-GRIN) Soybean Germplasm Collections have white flowers and are the second dominant accessions after the purple-flowered accessions. Earlier studies have shown that the w1 recessive allele of the W1 gene encoding flavonoid 3′,5′-hydroxylase produces white flowers. In the present study, we aimed to understand why the white-flowered accessions have become abundant among the cultivated soybeans and what their genetic and regional origin is. For this purpose, 99 landraces with white flowers and 39 landraces with purple flowers from eight Asian countries and Russia were analysed with regard to the nucleotide sequences of the W1 locus. We not only found that the w1 alleles of the 99 white-flowered landraces were identical to those of the white-flowered Williams 82, but also found that these w1 alleles displayed no polymorphism at all. By carrying out a phylogenetic analysis, we were able to identify a group with W1 alleles from which the w1 allele might have diverged.

A 44-year-old man developed sudden non-fluent aphasia and right hemiplegia due to left striatocapsular infarction (Figure). Neurologic examination revealed gaze deviation to the right with eyes closed, but not with eyes open (Video). There was no spontaneous or gaze-evoked nystagmus, even after elimination of visual fixation. Leftward pursuit was impaired in a craniotopic frame of reference, and horizontal saccades were hypometric in both directions. Head impulse test was normal in the horizontal plane and there were no visual field defects. The contralesional gaze deviation with eye closure persisted for ten days.

The prevalence of the feeling of cold hands and feet (FCHF) is high in the general population but the etiology of FCHF is largely unknown. The aim of the present study was to explore whether the FCHF is heritable. Eight hundred and ninety-four pairs of twins completed a question about FCHF. Tetrachoric correlations for FCHF were .58, .29, .67, .52, and .04 for monozygotic male, dizygotic male, monozygotic female, and dizygotic female twins, respectively. Model-fitting analyses suggested that in the best fitting model, additive genetic and nonshared environmental variance including measurement error were 64% (95% CI: 55%-72%) and 36% (28%-45%), respectively. Sex differences in genetic and environmental influences were not significant.

In this study, we synthesized ZnO nanowires using Au catalytic particles formed on a ZnO seed layer. We modulated the microstructure of the ZnO seed layer by changing the sputtering power to investigate how the underlying ZnO film microstructure affects the distribution of ZnO nanowires. Examining the samples after each of the three key steps of the growth process (ZnO seed layer deposition, Au catalytic particle formation, and nanowire growth) using various characterization methods such as scanning electron microscopy, transmission electron microscopy, and x-ray diffraction helped us illuminate the profound impacts of the grain size of the seed layer on the nanowire density.

Despite numerous previous studies, relationships between watershed land use and adjacent streams and rivers at various scales in Korea remain unclear. This study investigated the relationships between land uses and the physical, chemical, and biological characteristics of 720 sites of streams and rivers across the country. The land uses at two spatial scales, including a 1-km buffer and the base watershed management region (BWMR), were computed in a geographical information system (GIS) with a digital land use/land cover map. Characteristics of land uses at two spatial scales were then correlated with the monitored multidimensional characteristics of the streams and rivers. The results of this study indicate that land use types have significant effects on stream and river characteristics. Specifically, most characteristics were negatively correlated with the proportions of urban, rice paddy, agricultural, and bare soil areas and positively correlated with the amount of forest. The site-scale and BWMR-scale analyses suggest that BWMR land use patterns were more strongly related to ecological integrity than they were to site land use patterns. Improving our understanding of land use effects will largely depend on relating the results of site-specific studies that use similar response techniques and measures to evaluate ecological integrity. In addition, our results clearly indicate that the characteristics of streams and rivers are closely linked and that land use types differentially affect those characteristics. Thus, effective restoration and management for ecological integrity of lotic system should consider the physical, chemical, and biological factors in combination.

Oxidation-induced stress evolutions in Ta thin films were investigated using ex situ microstructure analyses and in situ wafer curvature measurements. It was revealed that Ta thin films are oxidized to a crystalline TaO2 layer, which is subsequently oxidized to an amorphous tantalum pentoxide (a-Ta2O5) layer. Initial layered oxidation from Ta to TaO2 phases abruptly induces high compressive stress up to about 3.5 GPa with fast diffusion of oxygen through the Ta layer. Subsequently, it is followed by stress relaxation with the oxidation time, which is related to the slow oxidation from TaO2 to Ta2O5 phases. The initial compressive stress originates from the molar volume expansion during the layered formation of TaO2 from the Ta layer, while the relaxation of the compressive stresses is ascribed to the amorphous character of the a-Ta2O5 layer. According to Kissinger's analysis of the stress evolution during an isochronic heating process, the oxygen diffusion process through the a-Ta2O5 layer is the rate-controlling stage in the layered oxidation process of forming a a-Ta2O5/TaO2/Ta multilayer and has an activation energy of about 190.8 kJ/mol.

The levels and distribution of polychlorinated biphenyl (PCB) congeners were analysed in fourteen soil and eight lichen (Usnea aurantiaco-atra) samples from King George Island, West Antarctica. A total of 32 PCB congeners were found in five soil samples collected in 2006, and the mean concentration of total PCBs was 20.4 pg g-1 dry weight (range, 8.0−33.8 pg g-1 dry weight). The most abundant PCB isomers in soil samples were di-, tri-, and penta-CBs, which accounted for more than 75% of the total residues. Twelve dioxin-like PCBs were also detected in nine soil and eight lichen samples, and the levels of dioxin-like PCBs were 5-fold higher in lichens than in soil. PCBs were detected at very low levels in most soil and lichen samples. The highest congener concentrations were found for PCB 118 (6.63 and 21.93 pg g-1 in soil and lichen, respectively) among dioxin-like PCBs. PCB levels in air samples were highly correlated with those in soil and lichen samples, as were PCB levels in soil and lichen samples collected at the same site. Long-range atmospheric transport is thought to be the main source of PCBs on King George Island. However, PCB levels in soil and lichen samples were also apparently influenced by local sources of PCBs.

We fabricated nc-Si TFTs in order to investigate the effect of the active-layer thickness on the characteristic of the nc-Si TFT. Bottom gate nc-Si TFTs were fabricated at 350°C using ICP-CVD. The thicknesses of the nc-Si layer were remained to 700, 1200 and 1700 Å. As the active-layer thickness increases, the mobility and the on-current level were not altered. However, the off-current level increased considerably and on/off ratio decreased. It may be attributed to highly doped characteristic of thick nc-Si film. As the nc-Si film thicker, the conductivity increases considerably and the Fermi level approaches to the conduction band minimum, which indicates the increases of doping level. The oxygen concentration shows high level of unintentional doping. Also, columnar growth of nc-Si film makes that the crystallinity of top region is much higher than that of bottom region. So, the conductivity of thick nc-Si film becomes high compared to that of thin nc-Si film. The structure of the nc-Si TFT with thick nc-Si film can be similar to the serial connection of N+, N- and N+ resistance, so that it suffers difficulty to suppress the off current and to secure high on/off ratio. Therefore, the off current can be suppressed by thinning of the high conducting active nc-Si layer and nc-Si TFT with channel thickness of 700 Å shows good on/off characteristic. It is deduced that bottom gate nc-Si TFT is necessary to have intrinsic channel layer as well as thin channel layer to reduce the leakage current.

The ZnO TFTs have attracted much attention as key component for flexible displays because they can be fabricated on plastic substrates at low temperature and exhibit good electrical performance. However, the ZnO films are polycrystalline with grain boundaries even if formed at room temperature, which deteriorate the uniformity of TFT characteristics. A few research groups have reported high performance amorphous indium-gallium-zinc oxide TFTs to solve the native problem of nonuniformity of ZnO TFTs. However, there are few researches on the process parameter effects on the variation of a-IGZO TFT characteristics. In this study, we focus on the effect of the source/drain overlap length on threshold voltage(VT) of a-IZO TFTs with differentiating channel deposition method. The experimental structures for this work are bottom-gated TFTs with a-IGZO channel that were deposited by RF and DC magnetron sputtering on glass. RF and DC sputtering were carried out by magnetron power density of (1.4 W/cm2)/ (2.0 W/cm2) in Ar/O2 gas ratio of (65/35)/(72/28), and the entire gas pressure were 5.0 mTorr and 3.4 mTorr. The width/length(um/um) of device was split to 10/7,10/10,10/30,10/50. Each of the patterns has seven source/drain overlap length: -3um,-2um,-1um,0um,1um,2um,3um. We extracted VT of RF and DC through the VG-ID curve. There are significant VT difference in both RF and DC according to the overlap length: VT of DC(RF) is 1.31(0.74)V at W/L=10/50 and 10.21(5.74)V at W/L=10/30. VT increases definitely where less than 1um overlap length and short channel TFT is more influenced by overlap length, which is more severe in RF group. We calculated total channel resistance (RT) from VD-ID curve. RT of devices with the positive overlap can be expressed by RT, Postive=Rch+Rc. Here, Rch is net channel resistance which becomes smaller when channel length decreases and Rc is contact resistance. RT with negative overlap, is RT, Negative=Rch+Rc+Roffset. Roffset is offset resistance formed by negative overlap and can be extracted by subtracting RT, Postive from total RT, Negative. The RT of DC(RF) at offset channel length of-1um,-2um,and-3um is 4.43105(2.7 106)cm, 1.17 106(3.48 106)cm, and 1.46 106(4.73 106)cm, respectively(W/L=10/10um) RF group which shows inferior electrical characteristics such as lower mobility and larger subthreshold slope to DC, have larger Roffset than the DC. This implies that the devices require a bit of positive source/drain overlap length for uniform VT especially when the channel resistance is high. But Overlap region causes difficulties in the device area to be miniaturized. In summary, as the source/drain overlap length decreases to negative value, the threshold voltage of a-IGZO TFTs increases sharply and these tendency strongly depends on a-IZO film quality, which means the overlap length is very important control parameter of a-IGZO TFTs for the uniform threshold voltage especially when the channel resistance is high

a-IGZO TFT is a promising candidate device for an alternative to poly-Si TFTs or a-Si TFTs, because they provide better uniformity in terms of their important device parameters, including the threshold voltage and mobility due to their amorphous phase, and a high mobility (>10 cm2/Vs) is attainable with these devices even in the amorphous phase. Recently, a-IGZO TFTs have been extensively studied by various groups. However, there is little report on interface and bulk effect on device performances and reliability as separately. For investigating the interface and bulk effect, we fabricated two a-IGZO thin film transistors with different channel deposition conditions, RF and DC magnetron sputtering. Specific conditions of RF and DC sputtering are described as follows; magnetron power density of 1.4 W/cm2/2.0 W/cm2 in Ar/O2 gas ratio of (65/35)/(72/28), and the entire gas pressure was 5.0 mTorr and 3.4 mTorr, respectively.In order to characterize the channel quality, C-V curve was measured with various frequencies of (10KHz˜1MHz). RF sputtered channel has higher frequency dependency compared to DC sputtered channel. It means that RF sputtered channel has higher bulk traps in channel compared to DC sputtered channel.

Device performance was characterized through the ID-VG measurement. Electrical parameters of RF and DC sputtered devices are VT=3.5/2.7V, on-off ratio=105/08, SS=2/0.4 V/decade, and uFE= 5/11 cm2/V-s, respectively. It is thus clear that the device performance of DC sputtered device is more superior to RF sputtered device. Therefore, it can be said that the poor device performance of RF device is ascribed to insufficient channel quality, as mentioned in C-V curve.

For reliability study, we measured PBTI and ID-VG hysteresis with normalized gate stress bias and high temperature hot chuck system. Through the unchanged field effect mobility during the stress and relaxation time, and nearly recovered VT and subthreshold slope (SS) after long relaxation time, we were able to know that pre-existed trap was main factor of reliability degradation. Moreover, SS degradation during stress time is more severe in RF device than DC device. It is also proving that RF channel characteristic is worse than DC channel. In high temperature, leakage current increments of RF device were more severe than DC device. This also indicates that bulk traps of RF device in channel region are larger than that of DC device. VT shift of DC sputtered device for PBT stress and hysteresis was higher than that of RF sputtered device. As well known, PBTI is closely related to insulator bulk traps, which shows that channel deposition conditions affect insulator trap characteristics. In summary, device performance of a-IGZO deposited by DC sputtering is better than RF sputtering, which is because DC sputtering improves channel quality of a-IGZO. However, VT shift of DC sputtered device are worse than RF sputtering, which may be related with high magnetron power density.

A vertebrate burrow-bearing layer of late Pleistocene age is commonly found at many Paleolithic archaeological sites in Korea. The burrows are straight to slightly curved in horizontal (plan) view and gently inclined in lateral (sectional) view. They are interpreted as having been produced by rodent-like mammals based on their size and architecture. The significance of such burrow-bearing layers as a characteristic stratigraphic marker unit is demonstrated by high burrow abundance, consistent stratigraphic position, lack of stratigraphic recurrence at these sites, and widespread geographic extent. Three dating methods, tephrochronology, radiocarbon, and OSL dating, were used to infer the age of these burrow-bearing layers. The dating results indicate that they were formed between ca. 40,000 and 25,000 yr (MIS 3−2), and this suggests that this layer can be used as a stratigraphic time-marker in late Pleistocene paleosol sequences for this region.