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Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 3 / June 2019
- Published online by Cambridge University Press:
- 04 March 2019, pp. 592-600
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- June 2019
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Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1810-1811
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- August 2018
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Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide — ERRATUM
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- Journal:
- MRS Communications / Volume 6 / Issue 4 / December 2016
- Published online by Cambridge University Press:
- 17 October 2016, p. 469
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- December 2016
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Atom probe tomography of phosphorus- and boron-doped silicon nanocrystals with various compositions of silicon rich oxide
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- Journal:
- MRS Communications / Volume 6 / Issue 3 / September 2016
- Published online by Cambridge University Press:
- 14 September 2016, pp. 283-288
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- September 2016
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In situ XPS investigation about the growth of the first atomic layer of Ta(N) films deposited by thermal TBTDET ALD
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1146 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1146-NN09-08
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- 2008
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