16 results
Benefits of Using a 4 srad XEDS Detector in Quantitative 3D-Compositional Analysis of Core@shell Nanoparticles
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 554-555
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- August 2022
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Thermal Stability of Au@Pt Nanoparticles Investigated by Electron Tomography
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 314-316
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- August 2022
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Fast electron low dose tomography for beam sensitive materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2116-2118
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- August 2021
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3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2606-2608
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- August 2020
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Novel Approaches for Electron Tomography to Investigate the Structure and Stability of Nanomaterials in 3 Dimensions.
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1128-1130
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- August 2020
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Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1808-1809
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- August 2019
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Spectral Electron Tomography as a Quantitative Technique to Investigate Functional Nanomaterials
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 274-275
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- July 2016
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Atomic resolution electron tomography
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- MRS Bulletin / Volume 41 / Issue 7 / July 2016
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- 07 July 2016, pp. 525-530
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- July 2016
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Materials Science Applications of Aberration Corrected TEM and/or STEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1131-1132
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- August 2015
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Towards Quantitative EDX Results in 3 Dimensions
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 766-767
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- August 2014
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Wet-STEM Tomography: Principles, Potentialities and Limitations
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- Microscopy and Microanalysis / Volume 20 / Issue 2 / April 2014
- Published online by Cambridge University Press:
- 26 February 2014, pp. 366-375
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- April 2014
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Structural and electrical characterization of carbon nanotube interconnects by combined transmission electron microscopy and scanning spreading resistance microscopy
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- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 13 September 2011, mrss11-1349-dd04-09
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- 2011
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Three-Dimensional Analysis of Carbon Nanotube Networks in Interconnects by Electron Tomography without Missing Wedge Artifacts
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- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 February 2010, pp. 210-217
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- April 2010
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High-Quality Sample Preparation by Low kV FIB Thinning for Analytical TEM Measurements
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- Microscopy and Microanalysis / Volume 13 / Issue 2 / April 2007
- Published online by Cambridge University Press:
- 01 March 2007, pp. 80-86
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- April 2007
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Probing Local Stoichiometry in InGaN Based Quantum Wells of Solid-State LEDs
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 294-295
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- August 2004
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TEM Annular Objective Apertures Fabricated by FIB
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1148-1149
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- August 2004
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