We present magnetoresistance (MR) data of high-vacuum magnetron sputtered NiFe/Cu multilayers (NiFe=Ni80Fe20) grown on Si(100) substrates with a Cu buffer layer and compare these with earlier results on Co/Cu(100) multilayers . Measured MR values are directly proportional to the antiferromagnetically coupled fraction in the multilayers. Extrapolating to full antiparallel alignment, we can make a reliable comparison of the MR with the magnetoresistance model of Levy, Zhang, and Fert [2,3]. For the NiFe/Cu multilayers the deduced spin-asymmetry parameters are for interface and bulk scattering, respectively. Although much smaller than in our Co/Cu multilayers, , it is still the spin dependence of the interface scattering that is the main cause for the large MR values.