Orientations of OH-vectors in structural hydroxyl groups of layer silicates were defined both from diffraction data and calculations of electrostatic energy. The comparison of the results showed that for the hydroxyls of the 2:1 layers of chlorites and micas the positions of the hydroxyl protons are mainly determined by electrostatics. For the hydroxyls of dickite, amesite, and the brucitic sheets of chlorite, the results derived by the two methods differed systematically from each other, pointing to a change in the nature of the bond in these OH-groups.

Structural and diffraction criteria for distinguishing between t-1M, c-1M, m-1M, and 3T illite varieties are described. The t-1M illite corresponds to a one-layer monoclinic structure with vacant transsites. The c-1M illite has vacant cis-octahedra forming one of two symmetrically independent point systems; the other cis-octahedra as well as the trans-octahedra are occupied; and the m-1M illite corresponds to the structure in which cations are statistically distributed over available trans- and cis-sites. For t-1M, c-1M, and m-1M, the values of |c cos β/a| are equal to 0.39–0.41, 0.29–0.31, and 0.333, respectively. Application of these criteria demonstrates that illite samples described in the literature as the 3T polytype usually are c-1M instead. The relatively common occurrence of c-1M illite in association with t-1M and 2M1 polytypes has been recognized in illite from hydrothermal alterations around uranium deposits located in the Athabasca basement (Saskatchewan, Canada). The c-1M illite from these deposits was previously described as 3T one.

The thicknesses of fundamental illite particles that compose mixed-layer illite-smectite (I-S) crystals can be measured by X-ray diffraction (XRD) peak broadening techniques (Bertaut-Warren-Averbach [BWA] method and integral peak-width method) if the effects of swelling and XRD background noise are eliminated from XRD patterns of the clays. Swelling is eliminated by intercalating Na-saturated I-S with polyvinylpyrrolidone having a molecular weight of 10,000 (PVP-10). Background is minimized by using polished metallic silicon wafers cut perpendicular to (100) as a substrate for XRD specimens, and by using a single-crystal monochromator. XRD measurements of PVP-intercalated diagenetic, hydrothermal and low-grade metamorphic I-S indicate that there are at least 2 types of crystallite thickness distribution shapes for illite fundamental particles, lognormal and asymptotic; that measurements of mean fundamental illite particle thicknesses made by various techniques (Bertant-Warren-Averbach, integral peak width, fixed cation content, and transmission electron microscopy [TEM]) give comparable results; and that strain (small differences in layer thicknesses) generally has a Gaussian distribution in the log-normal-type illites, but is often absent in the asymptotic-type illites.

The general approach to the problem of the real structure of smectites requires an analysis based on the relationship between structural characteristics and diffraction patterns. This paper, which considers only the models corresponding to dioctahedral smectites saturated by K-cations and collapsed, includes: 1. Successive consideration of all models which are crystallochemically possible. These models may differ in (i) the structure and chemical composition of layers and interlayer spaces; (ii) the azimuthal orientations, translations and the mode of alternation of the layers; (iii) independent parameters which describe quantitatively the models (e.g. abundance of each type of layer, probability parameters defining the succession of layers, …). 2. Calculation, in all accessible domains of reciprocal space, of the distribution of intensities and profile variations, obtained by changing only one parameter at a time, that defines one type of structural feature (e.g. cation distribution in individual layers, stacking of the layers, nature of stacking faults, …). 3. A systematical analysis of the calculated diffraction patterns to establish the diffraction criteria which will help to interpret the experimental data explicitly.

Olique-texture electron diffraction examination of K-saturated dioctahedral smectites after 70–100 wetting-drying cycles allows the determination of cation distribution between trans and cis octahedra of the 2:1 layers. Studies of smectites with different compositions has revealed a wide variety of occupancies of the available octahedral sites.

The quantitative interpretation of the reflection intensities of the SAED patterns of glauconites reveals the mechanism of migration of the octahedral sheet cations during heating up to 750°C. It confirms that Mg2+ has a greater ability than Fe3+ to migrate from cis-to trans-sites, as previously found by means of XRD pattern modelling. For samples heated to 650°C, the two formerly vacant trans-sites in the base-centred unit-cell become occupied, but differently, which leads to a primitive unit-cell, and the cis-sites remain filled almost entirely by Fe3+ only. The cation migration occurs through the nearest shared edges in the [010] and [310] directions. The samples heated to 750°C reveal a base-centred super-cell with A = 3a and B = b. All Mg cations leave the cis-sites to occupy completely four of the six available trans-sites of the super-cell. Migration also occurs through the shared edges in the [010] and [310] directions. The primitive unit-cell is not an intermediate step in the migration process leading to the super-cell. The existence of additional satellites in the SAED patterns of some crystals heated to 750°C corresponds to the existence of antiphase domains with a 3b/2 width and an antiphase shift of a/2.